New statistical technique improves precision of nanotechnology data
A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.Known as sequential profile adjustment by regression (SPAR), the technique could also reduce the amount of experimental data required to make conclusions, and help distinguish true nanoscale phenomena from experimental error.
New statistical technique improves precision of nanotechnology data
A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement ...
Wed 1 Jul 09 from PhysOrg
Statistical Technique Improves Precision Of Nanotechnology Data, Wed 1 Jul 09 from RedOrbit
New statistical technique improves precision of nanotechnology data, Wed 1 Jul 09 from e! Science News
Statistical Technique Improves Nanotechnology Data, Tue 30 Jun 09 from Newswise
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